DocumentCode :
1454850
Title :
Effective Voltage Flicker Calculation Based on Multiresolution S-Transform
Author :
Eghtedarpour, Navid ; Farjah, Ebrahim ; Khayatian, Alireza
Author_Institution :
Electr. & Comput. Eng. Dept., Shiraz Univ., Shiraz, Iran
Volume :
27
Issue :
2
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
521
Lastpage :
530
Abstract :
This paper introduces a new method for calculating the voltage flicker characteristics. A voltage waveform envelope, which captures the main flicker characteristics, is obtained by calculating rms values instantaneously using a moving window approach. The S-transform (ST) is then used to extract the voltage flicker components for each frequency. The multiresolution characteristic of the ST provides timing data which presents a “Magnitude-Time” and “Frequency-Time” contour for tracking flicker. The effects of signal sampling rate, voltage harmonics, and frequency variation on the calculation results are considered. The results show that the proposed method can identify the frequency and magnitude of flicker components in a short time and with very good precision. This method is independent of calculating the fundamental frequency of the system, which has been used for flicker index calculation. Finally, the method is tested on a real voltage flicker signal sampled from the voltage signal of an electric arc furnace. The results are quite promising.
Keywords :
harmonics suppression; power supply quality; signal sampling; wavelet transforms; flicker tracking; frequency time contour; frequency variation; magnitude time contour; moving window approach; multiresolution S-transform; signal sampling rate; voltage flicker calculation; voltage flicker components; voltage harmonics; voltage waveform envelope; Demodulation; Harmonic analysis; Signal resolution; Time frequency analysis; Voltage measurement; Wavelet transforms; Moving window method; S-transform; power quality (PQ); voltage flicker;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/TPWRD.2011.2182064
Filename :
6156492
Link To Document :
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