• DocumentCode
    1455189
  • Title

    Influence of electron velocity overshoot on collector transit times of HBTs

  • Author

    Ishibashi, Tadao

  • Author_Institution
    NTT LSI Lab., Kanagawa, Japan
  • Volume
    37
  • Issue
    9
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    2103
  • Lastpage
    2105
  • Abstract
    Collector transit times of heterojunction bipolar transistors with a pronounced electron velocity overshoot effect are investigated using a simple analytical model. The effective carrier velocity, νeff , which is a measure for determining the transit time, is defined as πC=WC/2νeff. It is found that νeff is much different from the average velocity, νav, that is given by the traveling time through the whole collector depletion layer and the depletion width. With a higher overshoot peak velocity, the collector transit time is shorter than that estimated simply from the average velocity νav
  • Keywords
    carrier mobility; heterojunction bipolar transistors; semiconductor device models; carrier velocity; collector depletion layer; collector transit times; electron velocity overshoot; heterojunction bipolar transistors; model; transit time; Analytical models; Capacitance; Current density; Delay effects; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Optical wavelength conversion; Time measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.57177
  • Filename
    57177