Title :
Influence of electron velocity overshoot on collector transit times of HBTs
Author :
Ishibashi, Tadao
Author_Institution :
NTT LSI Lab., Kanagawa, Japan
fDate :
9/1/1990 12:00:00 AM
Abstract :
Collector transit times of heterojunction bipolar transistors with a pronounced electron velocity overshoot effect are investigated using a simple analytical model. The effective carrier velocity, νeff , which is a measure for determining the transit time, is defined as πC=WC/2νeff. It is found that νeff is much different from the average velocity, νav, that is given by the traveling time through the whole collector depletion layer and the depletion width. With a higher overshoot peak velocity, the collector transit time is shorter than that estimated simply from the average velocity νav
Keywords :
carrier mobility; heterojunction bipolar transistors; semiconductor device models; carrier velocity; collector depletion layer; collector transit times; electron velocity overshoot; heterojunction bipolar transistors; model; transit time; Analytical models; Capacitance; Current density; Delay effects; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Optical wavelength conversion; Time measurement; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on