Title :
Internuclear cascade-evaporation model for LET spectra of 200 MeV protons used for parts testing
Author :
Neill, P. M O ; Badhwar, G.D. ; Culpepper, W.X.
Author_Institution :
NASA Johnson Space Center, Houston, TX, USA
fDate :
12/1/1998 12:00:00 AM
Abstract :
The Linear Energy Transfer (LET) spectrum produced in microelectronic components during testing with 200 MeV protons is calculated with an internuclear cascade-evaporation code. This spectrum is compared to the natural space heavy ion environment for various earth orbits. This comparison is used to evaluate the results of proton testing in terms of determining a firm upper bound to the on-orbit heavy ion upset rate and the risk of on-orbit heavy ion failures that would not be detected with protons
Keywords :
integrated circuit modelling; integrated circuit testing; proton effects; 200 MeV; LET spectra; internuclear cascade-evaporation model; microelectronic component; proton testing; space heavy ion upset rate; Aerospace electronics; Earth; Energy exchange; Microelectronics; Orbits; Performance evaluation; Protons; Silicon; System testing; Upper bound;
Journal_Title :
Nuclear Science, IEEE Transactions on
