Title :
Energy-resolved neutron SEU measurements from 22 to 160 MeV
Author :
Johansson, Karin ; Dyreklev, Peter ; Granbom, Bo ; Olsson, Nils ; Blomgren, Jan ; Renberg, P.-U.
Author_Institution :
Electromagn. Technol. Div., Ericsson Saab Avionics AB, Sweden
fDate :
12/1/1998 12:00:00 AM
Abstract :
The energy dependence of the neutron-induced single-event upset (NSEU) cross section for Static RAMs have been measured, using quasi-monoenergetic neutrons of five different energies from 22 to 160 MeV. The measured SEU cross sections were corrected for the low-energy neutron tail by an iterative folding procedure. A clear energy dependence has been found. The SEU rate has been compared both with results from testing with a neutron spallation spectrum up to 800 MeV and the measured SEU rate from In-Flight experiments at 20 km
Keywords :
SRAM chips; neutron effects; 22 to 160 MeV; NSEU cross section; SEU rate; energy dependence; energy resolved measurement; in-flight experiment; iterative folding; neutron induced single event upset cross section; neutron spallation spectrum; static RAM; Aerospace electronics; Collimators; Electromagnetic measurements; Energy measurement; Lithium; Neutrons; Particle beams; Single event upset; Spectroscopy; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
