DocumentCode :
1455316
Title :
Dielectric loaded HTS resonators as frequency standards and low-phase noise oscillators
Author :
Gallop, John C. ; Langham, Conway D. ; Hao, Ling ; Abbas, Farhat
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Volume :
46
Issue :
2
fYear :
1997
fDate :
4/1/1997 12:00:00 AM
Firstpage :
122
Lastpage :
125
Abstract :
High-quality, high-temperature superconducting (HTS) thin-films exhibit very low losses at microwave frequencies and, as a result, allow very high Q resonators to be produced. The size of such resonators may be significantly reduced by loading with low-loss single crystal dielectric. The potential for HTS dielectric loaded resonators as practical frequency standards and reference elements for low-phase-noise oscillators is assessed, with emphasis on operation at 60 K, a temperature readily attainable with compact Stirling cycle coolers
Keywords :
barium compounds; dielectric resonator oscillators; frequency measurement; high-temperature superconductors; low-temperature techniques; measurement standards; microwave measurement; superconducting cavity resonators; superconducting thin films; yttrium compounds; 60 K; HTS dielectric loaded resonators; Stirling cycle coolers; YBaCuO; dielectric loaded HTS resonators; frequency standards; high Q resonators; high-temperature superconducting thin-films; loading; low-loss single crystal dielectric; low-phase noise oscillators; low-phase-noise oscillators; microwave frequencies; reference elements; Dielectrics; High temperature superconductors; Microwave frequencies; Microwave oscillators; Resonant frequency; Superconducting device noise; Superconducting microwave devices; Superconducting transition temperature; Superconductivity; Surface impedance;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.571789
Filename :
571789
Link To Document :
بازگشت