Title :
Integrating analog-to-digital converter radiation hardness test technique and results
Author :
Kalashnikov, O.A. ; Demidov, A.A. ; Figurov, V.S. ; Nikiforov, A.Y. ; Polevich, S.A. ; Telets, V.A. ; Maljudin, S.A. ; Artamonov, A.S.
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
fDate :
12/1/1998 12:00:00 AM
Abstract :
The integrating ADC CMOS IC radiation hardness tests were performed. Dose rate, total dose and structural damage test techniques and results are presented and analyzed. It was found that low radiation hardness is inherent to an integrating ADC due to its operation principles
Keywords :
CMOS integrated circuits; analogue-digital conversion; failure analysis; integrated circuit reliability; integrated circuit testing; radiation hardening (electronics); A/D convertor testing; ADC radiation hardness test technique; CMOS IC radiation hardness; analog-to-digital converter; dose rate test; integrating ADC; structural damage test; total dose test; Analog-digital conversion; Circuit testing; Dosimetry; Logic arrays; Logic testing; Optical pulses; Switches; Threshold voltage; Transfer functions; X-ray lasers;
Journal_Title :
Nuclear Science, IEEE Transactions on
