• DocumentCode
    1455394
  • Title

    Integrating analog-to-digital converter radiation hardness test technique and results

  • Author

    Kalashnikov, O.A. ; Demidov, A.A. ; Figurov, V.S. ; Nikiforov, A.Y. ; Polevich, S.A. ; Telets, V.A. ; Maljudin, S.A. ; Artamonov, A.S.

  • Author_Institution
    Specialized Electron. Syst., Moscow, Russia
  • Volume
    45
  • Issue
    6
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    2611
  • Lastpage
    2615
  • Abstract
    The integrating ADC CMOS IC radiation hardness tests were performed. Dose rate, total dose and structural damage test techniques and results are presented and analyzed. It was found that low radiation hardness is inherent to an integrating ADC due to its operation principles
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; failure analysis; integrated circuit reliability; integrated circuit testing; radiation hardening (electronics); A/D convertor testing; ADC radiation hardness test technique; CMOS IC radiation hardness; analog-to-digital converter; dose rate test; integrating ADC; structural damage test; total dose test; Analog-digital conversion; Circuit testing; Dosimetry; Logic arrays; Logic testing; Optical pulses; Switches; Threshold voltage; Transfer functions; X-ray lasers;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.736504
  • Filename
    736504
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1455394