DocumentCode
1455412
Title
Damage mechanisms in radiation-tolerant amorphous silicon solar cells
Author
Srour, J.R. ; Vendura, G.J., Jr. ; Lo, D.H. ; Toporow, C.M.C. ; Dooley, M. ; Nakano, R.P. ; King, E.E.
Author_Institution
Space & Electron. Group, TRW Inc., Redondo Beach, CA, USA
Volume
45
Issue
6
fYear
1998
fDate
12/1/1998 12:00:00 AM
Firstpage
2624
Lastpage
2631
Abstract
The relative importance of ionization and displacement damage effects in irradiated amorphous silicon (a-Si) solar cells is demonstrated. Degradation of these devices by particles representative of a space radiation environment is dominated by ionizing radiation effects and not by displacement damage. Degradation of a-Si cells correlates with the ionizing dose deposited in device active regions for most of the cases examined. Specific dose deposition conditions are identified for which displacement damage effects evidently are important. Radiation-induced degradation of a-Si cells is demonstrated to anneal at temperatures much lower than for conventional crystalline solar cells. It is predicted that if these devices are operated in a space radiation environment at 70°C, annealing during irradiation will result in an end-of-life efficiency that is very near the beginning-of-life value. Thus, low-cost a-Si solar cells are attractive for space power applications in harsh radiation environments
Keywords
X-ray effects; amorphous semiconductors; annealing; electron beam effects; elemental semiconductors; proton effects; radiation hardening (electronics); silicon; solar cells; space vehicle power plants; 70 C; Si; amorphous Si solar cells; annealing; damage mechanisms; device active regions; displacement damage effects; harsh radiation environments; ionization effects; ionizing dose; ionizing radiation; irradiated solar cell; low-cost a-Si solar cells; radiation-tolerant solar cells; space power applications; space radiation environment; Amorphous silicon; Annealing; Crystallization; Degradation; Electrons; Ionizing radiation; Photovoltaic cells; Protons; Temperature; X-rays;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.736506
Filename
736506
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