Title :
Irradiated integrated circuits dose-attenuation mapping using optically stimulated phosphors for packaging dosimetry
Author :
Dusseau, L. ; Polge, G. ; Albert, L. ; Magnac, Y. ; Bessiere, J.C. ; Fesquet, J. ; Gasiot, J.
Author_Institution :
Centre d´´Electron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
fDate :
12/1/1998 12:00:00 AM
Abstract :
The feasibility of a dose mapping system using optically stimulated luminescent (OSL) phosphors is demonstrated. The OSL technique is briefly reviewed as well as its interest for calculation code calibration. The sensors and the reading apparatus are presented. An example of attenuation dose map obtained for a dual in line plastic package (DIL) is given and the results compared to calculations with the code EGS4 PRESTA. Results obtained by experiment and simulation are discussed as well as the potentialities of the method
Keywords :
dosimetry; integrated circuit packaging; integrated circuit reliability; phosphors; plastic packaging; radiation effects; EGS4 PRESTA; attenuation dose map; calculation code calibration; dose-attenuation mapping; dual in line plastic package; irradiated ICs; optically stimulated phosphors; packaging dosimetry; Dosimetry; Electronics packaging; Integrated optics; Optical attenuators; Optical films; Optical sensors; Phosphors; Photonic integrated circuits; Semiconductor device packaging; Stimulated emission;
Journal_Title :
Nuclear Science, IEEE Transactions on
