Title :
Ten-volt Josephson voltage standard at the ETL
Author :
Murayama, Yasushi ; Sakuraba, Toshiaki ; Sakamoto, Yasuhiko ; Iwasa, Akio ; Yoshida, Haruo ; Kozakai, Tsuneoki ; Endo, Tadashi
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
fDate :
4/1/1997 12:00:00 AM
Abstract :
A voltage standard system using a 10 V Josephson junction array has been developed. The uncertainty is 0.6×10-8 for measurement of the 10 V output of a Zener diode reference standard. A comparison of the 10 V array system with the conventional 10 V measurement system composed of a 1 V array and a voltage divider was performed through measurements of a 10 V output of a Zener. The result agreed within the uncertainty (2×10-8) of the comparison. The 10 V output voltages of a Zener reference standard are measured consecutively by the 10 V array system
Keywords :
calibration; measurement errors; measurement standards; superconductor-insulator-superconductor devices; voltage measurement; 10 V; ETL; Electrotechnical Laboratory; Josephson junction array; Josephson voltage standard; Nb-AlO-Nb; Nb/AlOx/Nb junctions; Zener diode reference standard; uncertainty; voltage standard system; Calibration; Diodes; Josephson junctions; Laboratories; Millimeter wave measurements; Millimeter wave technology; Pollution measurement; Semiconductor device measurement; Standards development; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
