• DocumentCode
    1455554
  • Title

    Radiation response of a MEMS accelerometer: an electrostatic force

  • Author

    Edmonds, L.D. ; Swift, G.M. ; Lee, C.I.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    45
  • Issue
    6
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    2779
  • Lastpage
    2788
  • Abstract
    Particle irradiation on the mechanical sensor of the ADXL50 microelectromechanical accelerometer shifts the output voltage. An earlier conclusion, that a dielectric below the sensor becomes charged, is extended by quantifying the effect of this charge on device output. It is shown that an electrostatic force is consistent with the observation that the output voltage shift is independent of acceleration. Possible charging mechanisms are suggested. An appendix derives a convenient algorithm for calculating electrostatic forces, which may also be used for other MEMS devices
  • Keywords
    accelerometers; microsensors; proton effects; ADXL50 microelectromechanical accelerometer; MEMS device; algorithm; dielectric charging; electrostatic force; mechanical sensor; particle irradiation; radiation response; voltage shift; Accelerometers; Capacitors; Circuits; Dielectric substrates; Electrostatics; Impedance; Micromechanical devices; Position measurement; Space technology; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.736528
  • Filename
    736528