Title :
Dichlorodimethylsilane as an anti-stiction monolayer for MEMS: a comparison to the octadecyltrichlorosilane self-assembled monolayer
Author :
Ashurst, W. Robert ; Yau, Christina ; Carraro, Carlo ; Maboudian, Roya ; Dugger, Michael T.
Author_Institution :
Dept. of Chem. Eng., California Univ., Berkeley, CA, USA
fDate :
3/1/2001 12:00:00 AM
Abstract :
This paper presents a quantitative comparison of the dichlorodimethylsilane (DDMS) monolayer to the octade-cyltrichlorosilane (OTS) self-assembled monolayer (SAM) with respect to the film properties and their effectiveness as anti-stiction coatings for micromechanical structures. Both coatings have been evaluated in several ways, including atomic force microscopy (AFM), contact angle analysis (CAA), work of adhesion by cantilever beam array (CBA) technique and coefficient of static friction using a sidewall testing device. While water and hexadecane contact angles are comparable, the DDMS coated microstructures exhibit higher adhesion than OTS coated ones. Furthermore, coefficient of static friction data indicate that the DDMS films are not as effective at lubrication as the OTS SAMs are, although both exhibit much improvement over chemical oxide. However, AFM data show that the samples which receive DDMS treatment accumulate fewer particles during processing than those which receive the OTS SAM treatment. The thermal stability of the DDMS film in air far exceeds the OTS SAM, as the DDMS remains very hydrophobic to temperatures upwards of 400°C
Keywords :
adhesion; atomic force microscopy; contact angle; micromechanical devices; monolayers; organic compounds; self-assembly; stiction; thermal stability; 400 C; DDMS; MEMS; OTS; anti-stiction monolayer; atomic force microscopy; cantilever beam array; contact angle; dichlorodimethylsilane; film coating; hydrophobicity; lubrication; micromechanical structure; octadecyltrichlorosilane; self-assembled monolayer; sidewall testing; static friction; thermal stability; work of adhesion; Adhesives; Atomic beams; Atomic force microscopy; Atomic layer deposition; Coatings; Computer aided analysis; Distributed decision making; Friction; Micromechanical devices; Structural beams;
Journal_Title :
Microelectromechanical Systems, Journal of