Title :
NIST comparison of the quantized Hall resistance and the realization of the SI OHM through the calculable capacitor
Author :
Jeffery, Anne-Marie ; Elmquist, R.E. ; Lee, Lai H. ; Shields, John Q. ; Dziuba, R.F.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
4/1/1997 12:00:00 AM
Abstract :
The latest NIST result from the comparison of the quantized Hall resistance (QHR) with the realization of the SI ohm obtained from the NIST calculable capacitor is reported. A small difference between the 1988 result and the present result has led to a re-evaluation of the sources and magnitudes of possible systematic errors
Keywords :
electric resistance measurement; measurement errors; measurement standards; quantum Hall effect; units (measurement); AC measurement; DC measurement; NIST comparison; SI OHM; calculable capacitor; quantized Hall resistance; systematic errors; Bridge circuits; Capacitors; Electrical resistance measurement; Electrodes; Helium; Measurement standards; Minerals; NIST; Optical interferometry; Resistors;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
