• DocumentCode
    1455631
  • Title

    Convex corner undercutting of {100} silicon in anisotropic KOH etching: the new step-flow model of 3-D structuring and first simulation results

  • Author

    Schröder, Henning ; Obermeier, Ernst ; Horn, Anton ; Wachutka, Gerhard K M

  • Author_Institution
    Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
  • Volume
    10
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    88
  • Lastpage
    97
  • Abstract
    In this paper, the mechanism of convex corner (CC) undercutting of Si{100} in pure aqueous KOH solutions is revisited by proposing the step-flow model of 3-D structuring as a proper description of the observed phenomena. The basic idea is to conceive the Si{100} anisotropic etching process, on the atomic scale, as a “peeling” process of terraced {111} planes at (110) oriented steps to understand also the arising shape in Si(100) etching. On the basis of our new model, we are able to predict the microscopic three-dimensional (3-D) structure of the characteristic CC undercutting without any compensation etchmask structures. Furthermore, the theoretical description has been implemented in a new 3-D simulation tool. Its ability to calculate the shape of simple beam structures of different orientation is experimentally shown
  • Keywords
    elemental semiconductors; etching; masks; micromachining; silicon; (110) oriented steps; 3D structuring; Si; anisotropic KOH etching; beam structures; convex corner undercutting; peeling; simulation tool; step-flow model; terraced {111} planes; Anisotropic magnetoresistance; Atomic measurements; Physics; Predictive models; Scanning electron microscopy; Shape; Silicon; Solid modeling; Thermodynamics; Wet etching;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.911096
  • Filename
    911096