Title :
SEU induced errors observed in microprocessor systems
Author :
Asenek, V. ; Underwood, C. ; Velazco, R. ; Rezgui, Sami ; Oldfield, M. ; Cheynet, Ph. ; Ecoffet, R.
Author_Institution :
Space Centre, Surrey Univ., Guildford, UK
fDate :
12/1/1998 12:00:00 AM
Abstract :
In this paper, we present software tools for predicting the rate and nature of observable SEU induced errors in microprocessor systems. These tools are built around a commercial microprocessor simulator and are used to analyse real satellite application systems. Results obtained from simulating the nature of SEU induced errors are shown to correlate with ground-based radiation test data
Keywords :
electronic engineering computing; errors; microcomputers; microprocessor chips; radiation effects; SEU induced errors; microprocessor simulator; microprocessor systems; single event upset; software tools; Analytical models; Application software; Microprocessors; Particle beams; Qualifications; Registers; Satellites; Software tools; System testing; Telecommunications;
Journal_Title :
Nuclear Science, IEEE Transactions on
