Recent results and future challenges for the NIST charged-capacitor experiment

Author

Zimmerman, Neil M. ; Cobb, Jonathan L. ; Clark, Alan F.

Author_Institution

Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

46

Issue

2

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

294

Lastpage

298

Abstract

This paper reports on recent results in some of the work toward developing a new capacitance standard using single electron tunneling (SET) devices. In particular, we plan on using a SET pump to charge a cryogenic standard capacitor and measure the voltage that develops. In this paper, we summarize: 1) measurements of the ratio of two capacitors in a bridge configuration, using a SET transistor as the null detector and 2) stability and leakage measurements on the cryogenic capacitors. We then discuss in detail several of the possible challenges, including the effects of stray capacitance and line impedance, and resulting requirements on the sensitivity of the SET null detector

Keywords

bridge circuits; capacitance measurement; capacitors; cryogenic electronics; measurement standards; single electron transistors; stability; tunnel transistors; tunnelling; NIST charged-capacitor experiment; SET null detector; SET pump; SET transistor; bridge configuration; capacitance standard; cryogenic capacitors; cryogenic standard capacitor; leakage measurements; line impedance; null detector; single electron tunneling devices; stability; stray capacitance; Capacitance; Capacitors; Charge measurement; Cryogenics; Current measurement; Electrons; Measurement standards; NIST; Standards development; Tunneling;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.571835

Filename

571835