DocumentCode :
1455667
Title :
Laterally driven electrostatic repulsive-force microactuators using asymmetric field distribution
Author :
Lee, Ki Bang ; Cho, Young-Ho
Author_Institution :
Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
Volume :
10
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
128
Lastpage :
136
Abstract :
We present a new electrostatic actuation method using a lateral repulsive-force induced by an asymmetric distribution of planar electrostatic field. The lateral repulsive-force has been characterized by a simple analytical equation, derived from a finite element simulation. Quality-factors are estimated from the computer simulation based on creep flow model. A set of repulsive-force polycrystalline silicon microactuators has been designed and fabricated by a four-mask surface-micromachining process. Static and dynamic response of the fabricated microactuators has been measured at the atmospheric pressure for the driving voltage range of 0-140 V. The static displacement of 1.27 μm is obtained at the dc voltage of 140 V. The resonant frequency of the repulsive-force microactuator increases from 11.7 kHz to 12.7 kHz when the dc induction voltage increases from 60 V to 140 V. The measured quality-factors are increased from 12 to 13 in the voltage range of 60-140 V. Fundamental characteristics of the force, frequency and quality-factor of the electrostatic repulsive-force microactuator have been discussed and compared with those of the conventional electrostatic attractive-force microactuator
Keywords :
Q-factor; electrostatic actuators; finite element analysis; micromachining; 0 to 140 V; 11.7 to 12.7 kHz; Si; asymmetric distribution; computer simulation; creep flow model; electrostatic actuator; finite element method; frequency tuning; lateral repulsive force; planar field; polycrystalline silicon microactuator; quality factor; resonant frequency; surface micromachining; Atmospheric modeling; Displacement measurement; Electrostatic actuators; Equations; Finite element methods; Force measurement; Frequency measurement; Microactuators; Pressure measurement; Voltage;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.911101
Filename :
911101
Link To Document :
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