DocumentCode
1455677
Title
A new approach for the prediction of the neutron-induced SEU rate
Author
Vial, C. ; Palau, J.-M. ; Gasiot, J. ; Calvet, M.-C. ; Fourtine, S.
Author_Institution
Centre d´´Electron. de Montpellier, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Volume
45
Issue
6
fYear
1998
fDate
12/1/1998 12:00:00 AM
Firstpage
2915
Lastpage
2920
Abstract
A new approach for SEU rate prediction in components submitted to neutron environment is presented. The method aims to take into account the characteristics of the secondary particles in terms of electrical effect. So, in addition to the critical energy/charge criterion generally used until now, two criteria are tentatively proposed : a critical LET and a limited distance in which energy must be deposited. The starting point of each computation is a common neutron-silicon interaction database
Keywords
neutron effects; charge criterion; critical LET; critical energy; electrical effect; electronic component; energy deposition range; neutron-induced SEU rate; neutron-silicon interaction database; secondary particles; single event upset; Aerospace electronics; Aerospace materials; Aircraft; Atmosphere; Databases; Ionization; Neutrons; Particle tracking; Silicon; Single event upset;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.736547
Filename
736547
Link To Document