Comparison of Zener voltage standard calibrations at 10 V between the KRISS and the ETL

Author

Kim, Kyu-Tae ; Han, Kwon Soo ; Sukamoto, Y. ; Sakuraba, Toshiaki

Author_Institution

Korea Res. Inst. of Stand. & Sci., Taejon, South Korea

Volume

46

Issue

2

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

314

Lastpage

317

Abstract

In order to promote the improvement of the KRISS´ 10 V calibration system a comparison of 10 V dc voltage calibrations between the Korea Research Institute of Standards and Science (KRISS, Korea) and the Electrotechnical Laboratory (ETL, Japan) was conducted from Sept.-Oct. 1995. A commercial Zener voltage standard was carried for the comparison. During the comparison an unexpected discrepancy was found and its origin was experimentally traced to find a correction value. After the correction was made, the result showed the two 10 V calibration systems, both of which are based on 10:1 divider and 1 V Josephson array were in a good agreement within an uncertainty or the comparison which was less than 0.1×10^-6. Uncertainty of the KRISS system has been improved to be 0.022×10^-6

Keywords

Zener diodes; calibration; measurement standards; voltage measurement; 1 V; 10 V; ETL; Electrotechnical Laboratory; Japan; Josephson array; KRISS; Korea; Zener voltage standard; calibration; uncertainty; voltage divider; voltage measurement; Calibration; Circuits; Filling; Laboratories; Resistors; Switches; System testing; Temperature; Uncertainty; Voltage measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.571844

Filename

571844