Low-frequency spectral analysis of DC nanovoltmeters and voltage reference standards

Author

Witt, Thomas J.

Author_Institution

Bur. Int. des Poids et Mesures, Sevres, France

Volume

46

Issue

2

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

318

Lastpage

321

Abstract

Low-frequency spectral analysis was carried out with a personal computer. The method was used to determine the bandwidths of dc nanovoltmeters and provide clear interpretations of the filter and statistical functions in these instruments. Once characterized, nanovoltmeters were used to study the noise characteristics of standard cells and Zener diode reference standards. The spectra led to the discovery of a temperature dependence in the output voltage of some Zener standards

Keywords

Zener diodes; computer aided analysis; electric noise measurement; measurement standards; microcomputer applications; semiconductor device noise; spectral analysis; statistical analysis; voltmeters; DC nanovoltmeters; Zener diode; Zener standards; bandwidths; filter; low-frequency spectral analysis; noise characteristics; personal computer; statistical functions; voltage reference standards; Bandwidth; Frequency response; Low-frequency noise; Measurement standards; Microcomputers; Spectral analysis; Temperature dependence; Voltage; Voltmeters; Working environment noise;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.571846

Filename

571846