DocumentCode :
1455706
Title :
Loading effects in resistance scaling
Author :
Elmquist, Randolph E. ; Dziuba, Ronald F.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
46
Issue :
2
fYear :
1997
fDate :
4/1/1997 12:00:00 AM
Firstpage :
322
Lastpage :
324
Abstract :
Reference resistors are affected by the heating of the resistor element caused by the measurement current. The effects of such loading are complex and can change in magnitude as a function or the initial state of the resistor and the external environment. This paper describes a method for determining relative lead coefficients by using cryogenic current comparator ratio measurements in a two-step scaling process, previously undiscovercd loading effects are analyzed using a resistance element made from copper, which has an easily measured change of resistance with temperature. The magnitude of loading effects in several types of resistors are listed
Keywords :
copper; cryogenic electronics; current comparators; electric resistance measurement; measurement standards; resistors; 100 ohm; 6453.2 ohm; Cu; cryogenic current comparator; loading effects; measurement current; ratio measurement; relative lead coefficients; resistance element; resistance scaling; two-step scaling process; Bridges; Copper; Cryogenics; Current measurement; Electric resistance; Electrical resistance measurement; NIST; Power measurement; Resistors; Temperature;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.571847
Filename :
571847
Link To Document :
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