Title :
Bifilar AC-DC resistor using a microwire
Author :
Semyonov, Yu.P. ; Klebanov, I. ; Lee, Rae Duk ; Kim, Han Jun
Author_Institution :
D.I Medeleyev Inst. of Metrol., St. Petersburg, Russia
fDate :
4/1/1997 12:00:00 AM
Abstract :
Bifilar ac-dc resistors of 6.45 kΩ to 103.2 kΩ consisting of a microwire and a fused silica bar, with extended nominal resistance, improved stability and reduced mechanical sensitivity, have been investigated and fabricated. In this resistor, a fused-silica rectangular bar was inserted between the wires of the bifilar loop to support the microwires and to increase capacitance between the wires. From resistance measurements at ac and dc for several resistors, the frequency correction factor was evaluated to be less than 2×10-8 in the frequency range from dc to 1.6 kHz. The resistors can be used as transportable standards for direct comparison with the quantized Hall resistance at both dc and ac, for calibration of the ac standard resistors and the ratio of transformer bridges
Keywords :
calibration; electric resistance measurement; measurement standards; quantum Hall effect; resistors; stability; 0 to 1.6 kHz; 6.45 to 103.2 kohm; SiO2; bifilar AC-DC resistor; direct comparison; extended nominal resistance; frequency correction factor; fused silica bar; fused-silica rectangular bar; mechanical sensitivity; microwire; quantized Hall resistance; stability; transformer bridges; transportable standards; Calibration; Capacitance; Electrical resistance measurement; Frequency; Resistors; Silicon compounds; Stability; Thermal resistance; Vibrations; Wires;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
