Title :
Sine-fit versus discrete Fourier transform-based algorithms in SNR testing of waveform digitizers
Author :
Bertocco, Matteo ; Narduzzi, Claudio
Author_Institution :
Dipt. di Elettronica e Inf., Padova Univ., Italy
fDate :
4/1/1997 12:00:00 AM
Abstract :
The performance of discrete Fourier transform (DFT)-based algorithms employed in signal-to-noise-ratio (SNR) testing of waveform digitizers is analyzed and compared to the performance obtained using sine-fit procedures. Theoretical results are recalled, emphasizing their relevance and importance. Evaluations based on experimental data, obtained by an 8-bit digitizing oscilloscope, show that the accuracies approaches are comparable, while in several respects the methods appear complementary, rather than alternative
Keywords :
analogue-digital conversion; discrete Fourier transforms; waveform generators; SNR testing; complementary methods; discrete Fourier transform-based algorithms; sine-fit algorithms; waveform digitizers; Algorithm design and analysis; Discrete Fourier transforms; Frequency; Instruments; Oscilloscopes; Performance evaluation; Sampling methods; Signal processing algorithms; Signal to noise ratio; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
