DocumentCode
1455913
Title
Evaluating Stratification Alternatives to Improve Software Defect Prediction
Author
Pelayo, L. ; Dick, Scott
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
Volume
61
Issue
2
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
516
Lastpage
525
Abstract
Numerous studies have applied machine learning to the software defect prediction problem, i.e. predicting which modules will experience a failure during operation based on software metrics. However, skewness in defect-prediction datasets can mean that the resulting classifiers often predict the faulty (minority) class less accurately. This problem is well known in machine learning, and is often referred to as “learning from imbalanced datasets.” One common approach for mitigating skewness is to use stratification to homogenize class distributions; however, it is unclear what stratification techniques are most effective, both generally and specifically in software defect prediction. In this article, we investigate two major stratification alternatives (under-, and over-sampling) for software defect prediction using Analysis of Variance. Our analysis covers several modern software defect prediction datasets using a factorial design. We find that the main effect of under-sampling is significant at α = 0.05, as is the interaction between under- and over-sampling. However, the main effect of over-sampling is not significant.
Keywords
learning (artificial intelligence); software metrics; software quality; statistical analysis; analysis of variance; factorial design; imbalanced datasets; machine learning; software defect prediction; software metrics; stratification alternatives; stratification techniques; Accuracy; Algorithm design and analysis; Analysis of variance; Machine learning; Measurement; Object oriented modeling; Software; Learning in imbalanced datasets; machine learning; non-parametric models; software fault-proneness; software reliability; stratification;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2012.2183912
Filename
6156808
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