• DocumentCode
    1455938
  • Title

    Capacitance scaling system

  • Author

    Aoki, Toshiaki ; Yokoi, Katsumi

  • Author_Institution
    Meas. Standards Center, Hewlett-Packard Japan Ltd., Tokyo, Japan
  • Volume
    46
  • Issue
    2
  • fYear
    1997
  • fDate
    4/1/1997 12:00:00 AM
  • Firstpage
    474
  • Lastpage
    476
  • Abstract
    A capacitance scaling system has been developed and consists of a commercially available four-terminal-pair LCR meter, an inductive voltage divider (IVD), and a 1000 pF air dielectric capacitor. It can calibrate capacitors up to 1 μF in the frequency range from 50 Hz to 100 kHz. The combined standard uncertainty for the 0.01 μF at 100 kHz is estimated to be ±73 fF (7.3×10-6)
  • Keywords
    calibration; capacitance measurement; measurement errors; measurement standards; voltage dividers; 1000 pF; 50 Hz to 100 kHz; air dielectric capacitor; calibration; capacitance scaling system; combined standard uncertainty; four-terminal-pair LCR meter; inductive voltage divider; Calibration; Capacitance measurement; Capacitors; Dielectric measurements; Frequency; Impedance measurement; Measurement standards; NIST; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.571889
  • Filename
    571889