Development of a rapid-single-flux-quantum shift register for applications in RF noise power metrology

Author

Kessel, Wolfgang ; Buchholz, Friedrich-Immanuel ; Khabipov, Marat I. ; Dolata, Ralf ; Niemeyer, Jurgen

Author_Institution

Phys. Tech. Bundesanstalt, Braunschweig, Germany

Volume

46

Issue

2

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

477

Lastpage

481

Abstract

Shift registers operated in digital feedback mode and utilized as pseudo random noise generators are very attractive for application as noise standards in rf noise power metrology. The paper reports on the concept of the integrated circuits required, based on superconducting Rapid-Single-Flux-Quantum (RSFQ) logic, and realized in Nb/Al₂O₃-Al/Nb technology. The design and layout of an 8-bit shift register is presented. Measurement results are reported which prove correct functionality for clock frequencies up to 45 GHz for standard operation. Typical bias current margins for operation of the shift register are ±27%. Further narrow-band limited ranges of operation have been found up to 60 GHz

Keywords

aluminium; aluminium compounds; calibration; electric noise measurement; feedback; measurement standards; niobium; shift registers; superconducting logic circuits; 0 to 60 GHz; 8 bit; Nb-Al₂O₃-Al-Nb; Nb/Al₂O₃-Al/Nb; RF noise power metrology; bias current margins; clock frequencies; digital feedback mode; narrow-band limited ranges; noise standards; rapid-single-flux-quantum shift register; superconducting RSFQ logic; Feedback; Integrated circuit noise; Integrated circuit technology; Metrology; Niobium; Noise generators; Shift registers; Superconducting device noise; Superconducting integrated circuits; Superconducting logic circuits;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.571890

Filename

571890