Title :
Adding noise to improve measurement
Author :
Andò, Bruno ; Graziani, Salvatore
Author_Institution :
Dept. Elettrico, Elettronico e Sistemistico, Catania Univ., Italy
fDate :
3/1/2001 12:00:00 AM
Abstract :
We have shown the possibility of improving the performance of several system classes in the presence of noise. The strategy depends on the application. Stochastic resonance can reduce threshold while suitable noise modulation can linearize thresholds
Keywords :
Brownian motion; distance measurement; electron device noise; infrared detectors; noise generators; parameter estimation; stochastic systems; trigger circuits; Brownian motion; IR detector; QDW system; SQUID; Schmitt trigger; dithering; noise generation; noise modulation; noise tuning; parameter optimisation; stochastic resonance; threshold; threshold reduction; Fluctuations; Instruments; Linear systems; Noise level; Noise measurement; Resonant frequency; Stochastic resonance; Stochastic systems; Strontium; Transfer functions;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/5289.911170
