DocumentCode
1456148
Title
Adding noise to improve measurement
Author
Andò, Bruno ; Graziani, Salvatore
Author_Institution
Dept. Elettrico, Elettronico e Sistemistico, Catania Univ., Italy
Volume
4
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
24
Lastpage
31
Abstract
We have shown the possibility of improving the performance of several system classes in the presence of noise. The strategy depends on the application. Stochastic resonance can reduce threshold while suitable noise modulation can linearize thresholds
Keywords
Brownian motion; distance measurement; electron device noise; infrared detectors; noise generators; parameter estimation; stochastic systems; trigger circuits; Brownian motion; IR detector; QDW system; SQUID; Schmitt trigger; dithering; noise generation; noise modulation; noise tuning; parameter optimisation; stochastic resonance; threshold; threshold reduction; Fluctuations; Instruments; Linear systems; Noise level; Noise measurement; Resonant frequency; Stochastic resonance; Stochastic systems; Strontium; Transfer functions;
fLanguage
English
Journal_Title
Instrumentation & Measurement Magazine, IEEE
Publisher
ieee
ISSN
1094-6969
Type
jour
DOI
10.1109/5289.911170
Filename
911170
Link To Document