• DocumentCode
    1456148
  • Title

    Adding noise to improve measurement

  • Author

    Andò, Bruno ; Graziani, Salvatore

  • Author_Institution
    Dept. Elettrico, Elettronico e Sistemistico, Catania Univ., Italy
  • Volume
    4
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    24
  • Lastpage
    31
  • Abstract
    We have shown the possibility of improving the performance of several system classes in the presence of noise. The strategy depends on the application. Stochastic resonance can reduce threshold while suitable noise modulation can linearize thresholds
  • Keywords
    Brownian motion; distance measurement; electron device noise; infrared detectors; noise generators; parameter estimation; stochastic systems; trigger circuits; Brownian motion; IR detector; QDW system; SQUID; Schmitt trigger; dithering; noise generation; noise modulation; noise tuning; parameter optimisation; stochastic resonance; threshold; threshold reduction; Fluctuations; Instruments; Linear systems; Noise level; Noise measurement; Resonant frequency; Stochastic resonance; Stochastic systems; Strontium; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/5289.911170
  • Filename
    911170