DocumentCode :
1456414
Title :
International intercomparison of silicon density standards
Author :
Bettin, Horst ; Gläser, Michael ; Spieweck, Frank ; Toth, Hans ; Sacconi, Attilio ; Peuto, Anna ; Fujii, Ken-ichi ; Tanaka, Mitsuru ; Nezu, Yoshiaki
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume :
46
Issue :
2
fYear :
1997
fDate :
4/1/1997 12:00:00 AM
Firstpage :
556
Lastpage :
559
Abstract :
In order to obtain a more accurate value for the Avogadro constant NA the reliability of density values obtained by different measuring techniques for silicon single crystals was checked by density determinations with four silicon spheres at PTB, IMGC, and NRLM. The diameters of the spheres (two of PTB and two of NRLM) ranged from 90 mm to 94 mm. All the mass measurements (at PTB, IMGC, and NRLM) were carried out in air. At IMGC and NRLM the volume was determined by interferometric measurements, whereas at PTB the volume was obtained from hydrostatic weighings using two Zerodur volume standards. In addition, at PTB the densities of the four spheres were cross-checked by flotation measurements. The maximum relative density difference was found to be 1×10-6, whereas the typical values were 2×10-7
Keywords :
constants; density measurement; elemental semiconductors; measurement standards; silicon; 90 to 94 mm; Avogadro constant; IMGC; NRLM; PTB; Si; Si density standards; Zerodur volume standards; absolute density; density values; flotation measurements; hydrostatic weighing; interferometric measurements; international intercomparison; mass measurements; reliability; silicon spheres; Atomic measurements; Crystals; Density measurement; Force measurement; Measurement standards; Performance evaluation; Shape measurement; Silicon; Volume measurement; Wavelength measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.571912
Filename :
571912
Link To Document :
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