Title :
Measuring the molar mass of silicon for a better Avogadro constant: reduced uncertainty
Author :
Gonfiantini, Roberto ; Bièvre, Paul De ; Valkiers, Staf ; Taylor, Philip D P
Author_Institution :
Inst. for Reference Mater. & Meas. European Comm., Joint Res. Centre, Geel, Belgium
fDate :
4/1/1997 12:00:00 AM
Abstract :
The current 3×10-5 relative combined uncertainty the isotope amount ratio measurements in natural Si must be improved in order to obtain a relative combined uncertainty on the molar mass smaller than 1×10-7. One of the problems is the isotopic effect, which accompanies adsorption/desorption processes of SiF4 in the mass spectrometer inlet system. The value of M(Si) observed in 1994/95 was confirmed in this work to within 10-7 M(Si), which means that the adsorption/desorption models developed are (quantitatively) correct to describe and predict isotopic effects due to memory at uncertainty levels of ⩽1×10-5 R and ⩽1×10-7 M(Si). It also shows that the previously measured isotope amount ratio values and derived molar masses have a lower uncertainty. The results obtained by using models compare well with those obtained after chemical cleaning of the mass spectrometer inlet system and reduce the relative combined uncertainty from 3×10-7 M(Si) to 1.3×10-7 M(Si). The new M(Si) for the “Avogadro Crystal” WASO 17.2 is 28.085 384 2 (35) g·moi-1 as compared to 28.085 383 1 (89) g mol-1 previously obtained. The new value of the Avogadro constant is 6.022 136 7 (48)×1023 mol-1 as compared to 6.022 136 5 (51)×1023 mol-1 previously obtained
Keywords :
adsorption; constants; desorption; mass spectroscopy; measurement errors; silicon; silicon compounds; Avogadro Crystal; Avogadro constant; Si; SiF4; adsorption/desorption models; adsorption/desorption processes; isotope amount ratio measurement; isotopic effects; mass spectrometer inlet system; memory effects; molar mass; molar masses; relative combined uncertainty; uncertainty; Chemicals; Cleaning; Current measurement; Fluid flow; Gold; Ion sources; Isotopes; Mass spectroscopy; Predictive models; Silicon;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on