Title :
Precision edge contrast and orientation estimation
Author :
Lyvers, Edward P. ; Mitchell, O. Robert
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
fDate :
11/1/1988 12:00:00 AM
Abstract :
The contrast and orientation estimation accuracy of several edge operators that have been proposed in the literature is examined both for the noiseless case and in the presence of additive Gaussian noise. The test image is an ideal step edge that has been sampled with a square-aperture grid. The effects of subpixel translations and rotations of the edge on the performance of the operators are studied. It is shown that the effect of subpixel translations of an edge can generate more error than moderate noise levels. Methods with improved results are presented for Sobel angle estimates and the Nevatia-Babu operator, and theoretical noise performance evaluations are also provided. An edge operator based on two-dimensional spatial moments is presented. All methods are compared according to worst-case and RMS error in an ideal noiseless situation and RMS error under various noise levels
Keywords :
pattern recognition; picture processing; 2-D spatial moments; Gaussian noise; Nevatia-Babu operator; RMS error; Sobel angle estimates; edge contrast; orientation estimation; pattern analysis; picture processing; square-aperture grid; subpixel translations; Additive noise; Apertures; Face detection; Gaussian noise; Image edge detection; Image sampling; Intelligent systems; Noise level; Scholarships; Testing;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on