DocumentCode
1457031
Title
Resonant Frequency of a Rectangular Patch Sensor Covered With Multilayered Dielectric Structures
Author
Li, Yang ; Bowler, Nicola
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume
58
Issue
6
fYear
2010
fDate
6/1/2010 12:00:00 AM
Firstpage
1883
Lastpage
1889
Abstract
This paper presents a simple analytical model for the resonant frequency of a rectangular patch sensor covered with multilayered dielectric structures. The accuracy of this model, while the relative permittivity of the dielectric top layers varies from 1 to 10.2, is verified with Ansoft´s high frequency structural simulator (HFSS) calculations and with experimental measurements. Comparison with HFSS simulation results show that the average error of the proposed model for three-layer test structures with various sets of relative permittivities and thicknesses is 2% or smaller. Merits of this model also include low calculation cost and mathematical simplicity. The robustness of this model for test structures with less than three layers is also validated by comparing with experimental measurement, HFSS simulation and well-established theory. This model can also be directly used to predict the resonant frequencies of rectangular patch antennas covered with multilayered dielectric superstrates.
Keywords
dielectric materials; dielectric resonance; microstrip antennas; permittivity; high frequency structural simulator calculations; microstrip antennas; multilayered dielectric structures; multilayered dielectric superstrates; rectangular patch antennas; rectangular patch sensor; relative permittivities; relative permittivity; resonant frequency; Analytical models; Antenna measurements; Costs; Dielectric measurements; Frequency measurement; Mathematical model; Permittivity measurement; Resonant frequency; Robustness; Testing; Microstrip antennas; nondestructive testing; permittivity; resonance; sensors;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.2010.2046871
Filename
5439885
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