• DocumentCode
    1458308
  • Title

    Nonlinear Optical Properties of Si Nanodot in {\\rm Al}_{2}{\\rm O}_{3} Matrix

  • Author

    Anchala, Anchala ; Purohit, Shiv Prasad ; Mathur, Kailash Chandra

  • Author_Institution
    Dept. of Phys. & Mater. Sci. & Eng., Jaypee Inst. of Inf. Technol., Noida, India
  • Volume
    48
  • Issue
    5
  • fYear
    2012
  • fDate
    5/1/2012 12:00:00 AM
  • Firstpage
    628
  • Lastpage
    634
  • Abstract
    The linear and the third-order nonlinear optical properties associated with intersubband transitions are studied for spherical Si nanodot embedded in an amorphous matrix. The effect of radiation intensity and the change in the size of the dot are investigated on the nonlinear photoabsorption coefficient, refractive index change, and the third-order nonlinear optical susceptibility for transitions from ground state (1s-1p) and excited states (1p-1d, 2s-2p). The oscillator strength is also calculated for these transitions along with the photoelectric cross sections from the initial 1s and 2s states of the dot. It is noted that a decrease in the size of the dot leads to blue shift in peak positions of photoabsorption coefficient, refractive index change, and third-order nonlinear susceptibility involving transitions from the ground and excited states.
  • Keywords
    excited states; ground states; nanostructured materials; nonlinear optical susceptibility; photoexcitation; refractive index; silicon; spectral line shift; Al2O3; Si; amorphous matrix; blue shift; excited states; ground state; intersubband transitions; nanodots; nonlinear optical properties; nonlinear photoabsorption coefficient; oscillator strength; photoelectric cross sections; radiation intensity; refractive index change; third-order nonlinear optical susceptibility; Aluminum oxide; Nonlinear optics; Optical refraction; Optical variables control; Quantum dots; Refractive index; Silicon; Nanodot; nonlinear; photoabsorption; photoelectric;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2012.2189097
  • Filename
    6158568