Title : 
A Statistical Polarimetric Decomposition Solution Based on the Maximum-Likelihood Estimator
         
        
            Author : 
Shi, Lei ; Li, Pingxiang ; Yang, Jie ; Zhang, Liangpei
         
        
            Author_Institution : 
State Key Lab. of Inf. Eng. in Surveying, Mapping & Remote Sensing, Wuhan Univ., Wuhan, China
         
        
        
        
        
        
        
            Abstract : 
This letter addresses a statistical model-based decomposition solution for polarimetric synthetic aperture radar imagery. The Wishart distribution is introduced to the two-component Freeman-Durden (2FD) model to enhance the traditional direct solution (2FD-DS) accuracy. This letter proposes a maximum-likelihood estimator (MLE) (2FD-MLE) expression which is simple enough to numerically solve 2FD unknowns. Furthermore, the statistical randomness impact is observed for the first time. The authors go on to verify that the decomposition results can be greatly improved by MLE, even in a simple physical model. The experiments show that the MLE enhances the estimation accuracy of land-cover types. At a moderate-look scale, the 2FD-MLE has less negative span flaws than the 2FD-DS method, and the estimation results are more close to the physical interpretation.
         
        
            Keywords : 
maximum likelihood estimation; remote sensing by radar; synthetic aperture radar; vegetation; 2FD unknowns; 2FD-DS method; MLE 2FD-MLE expression; Wishart distribution; land-cover types; maximum-likelihood estimator; moderate-look scale; physical model; polarimetric synthetic aperture radar imagery; statistical model-based decomposition solution; statistical polarimetric decomposition solution; statistical randomness; two-component Freeman-Durden model; vegetation parameter retrieval; Accuracy; Coherence; Maximum likelihood estimation; Numerical models; Remote sensing; Maximum-likelihood estimator (MLE); polarimetric;
         
        
        
            Journal_Title : 
Geoscience and Remote Sensing Letters, IEEE
         
        
        
        
        
            DOI : 
10.1109/LGRS.2012.2185214