DocumentCode :
1459304
Title :
High-Performance Flexible a-IGZO TFTs Adopting Stacked Electrodes and Transparent Polyimide-Based Nanocomposite Substrates
Author :
Chien, Chih-Wei ; Wu, Cheng-Han ; Tsai, Yu-Tang ; Kung, Yen-Cheng ; Lin, Chang-Yu ; Hsu, Po-Ching ; Hsieh, Hsing-Hung ; Wu, Chung-Chih ; Yeh, Yung-Hui ; Leu, Chyi-Ming ; Lee, Tzong-Ming
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
58
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1440
Lastpage :
1446
Abstract :
We demonstrated flexible amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors (TFTs) on fully transparent and high-temperature polyimide-based nanocomposite substrates. The flexible nanocomposite substrates were coated on the carrier glass substrates and were debonded after the TFT microfabrication. The adoption of the Ti/IZO stacked electrodes as source/drain/ gain electrodes significantly improved the etching compatibility with other material layers, enabling successful implementation of flexible a-IGZO TFTs onto the transparent nanocomposite substrates by conventional lithographic and etching processes. The flexible a-IGZO TFTs exhibited decent mobility and mechanical bending capability. Field-effect mobility of up to 15.9 cm2/V · s, a subthreshold swing of 0.4 V/dec, a threshold voltage of 0.8 V, and an on/off ratio of >; 108 were extracted from the TFT characteristics. The devices could be bent down to a radius of curvature of 3 mm and yet remained normally functional. Such successful demonstration of flexible oxide TFTs on transparent flexible substrates using fully lithographic and etching processes that are compatible with existing TFT fabrication technologies shall broaden their uses in flexible displays and electronics.
Keywords :
II-VI semiconductors; bending; carrier mobility; etching; flexible electronics; gallium compounds; indium compounds; lithography; thin film transistors; wide band gap semiconductors; zinc compounds; InGaZnO; Ti-InZnO; carrier glass substrates; etching compatibility; field-effect mobility; flexible a-IGZO TFT; flexible amorphous thin-film transistors; high-temperature substrates; lithography; mechanical bending; source-drain-gain electrodes; stacked electrodes; subthreshold swing; threshold voltage; transparent polyimide-based nanocomposite substrates; Dry etching; Electrodes; Substrates; Surface roughness; Thin film transistors; Flexible thin-film transistors (TFTs); In–Ga–Zn–O (IGZO); nanocomposite; polyimide (PI);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2109041
Filename :
5720302
Link To Document :
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