Title :
All-Optical Wavelength Conversion of 10 Gb/s RZ-OOK Data in a Silicon Nanowire via Cross-Phase Modulation: Experiment and Theoretical Investigation
Author :
Driscoll, Jeffrey B. ; Astar, W. ; Liu, Xiaoping ; Dadap, Jerry I. ; Green, William M J ; Vlasov, Yurii A. ; Carter, Gary M. ; Osgood, Richard M., Jr.
Author_Institution :
Microelectron. Sci. Labs., Columbia Univ., New York, NY, USA
Abstract :
Wavelength conversion of a 10 Gb/s 2.7%-duty-cycle return-to-zero (RZ) OOK (RZ-OOK) signal using XPM in a compact silicon nanowire waveguide (Si nanowire) and a detuned filter is successfully demonstrated for the first time. A 10-9-BER receiver sensitivity penalty of <;1 dB was measured for the converted signal relative to the baseline signal, with a filter-probe detuning of 0.6 nm. The system is numerically modeled and the results are shown to match well with the experimental results. The numerical model is further used to design an optimal filter that would eliminate filter-probe detuning.
Keywords :
error statistics; nanowires; optical filters; optical modulation; optical receivers; optical waveguides; optical wavelength conversion; phase modulation; BER receiver; RZ-OOK signal; all-optical wavelength conversion; compact silicon nanowire waveguide; cross-phase modulation; duty-cycle return-to-zero; filter-probe detuning; sensitivity penalty; Integrated optics; nonlinear optics; optical frequency conversion; optical signal processing; optical waveguides; silicon-on-insulator technology;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2009.2038352