Title :
A novel AC current source for capacitance-based displacement measurements
Author :
Nerino, Roberto ; Sosso, Andrea ; Picotto, Gian Bartolo
Author_Institution :
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
fDate :
4/1/1997 12:00:00 AM
Abstract :
A 100 kHz bandwidth AC current source suitable to be used with capacitive sensors in displacement measurement applications has been designed and constructed. The high output impedance of the source is obtained by sensing the load voltage with a buffer stage having very low input capacitance. The sensing-buffer power supply, its shield, and the input shielding connections are driven at the buffer input potential in such a way that the effect of all input parasitic admittances, including the buffer common-mode impedance, are almost suppressed. The load impedance variations, which are directly proportional to displacements, are monitored by the output voltage of the sensing buffer. Measurements made at different frequencies with calibrated capacitance loads ranging from (1 to 20) pF have shown that the load-impedance values are proportional to the output voltage of the sensing buffer with a linearity better than 4×10-4 and resolution of about 3×10-5 over a 1 kHz bandwidth of load variation signal. The features of the current source and its performance in a displacement measurement application are described
Keywords :
calibration; capacitance measurement; displacement measurement; electric sensing devices; measurement standards; shielding; 1 to 20 pF; 100 kHz; AC current source; buffer common-mode impedance; buffer input potential; calibrated capacitance loads; capacitance-based displacement measurements; input capacitance; input parasitic admittances; input shielding connections; linearity; load voltage; load-impedance values; output impedance; resolution; Bandwidth; Capacitance measurement; Capacitive sensors; Displacement measurement; Frequency measurement; Impedance; Monitoring; Parasitic capacitance; Power supplies; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on