Title :
An Extrapolation Method for Improving Waveguide Probe Material Characterization Accuracy
Author :
Dester, Gary D. ; Rothwell, Edward J. ; Havrilla, Michael J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fDate :
5/1/2010 12:00:00 AM
Abstract :
Waveguide probes are useful for extracting the electric and magnetic properties of material layers, but the accuracy of the results is limited by the accuracy of the theoretical model. Using more modes in the expansion of the waveguide fields produces better results, but the computational cost increases with the number of modes squared. This letter analyzes the dependence of solution accuracy on the number of modes used and, based on this, introduces an extrapolation technique that allows the number of modes to be significantly reduced with little loss of accuracy.
Keywords :
extrapolation; materials testing; mode matching; probes; waveguide junctions; waveguide theory; electric property extraction; extrapolation method; magnetic property extraction; material layers; material testing; mode matching methods; waveguide junctions; waveguide probe material; Error analysis; materials testing; microwave measurements; mode matching methods; waveguide junctions;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2010.2045600