• DocumentCode
    1459824
  • Title

    An Extrapolation Method for Improving Waveguide Probe Material Characterization Accuracy

  • Author

    Dester, Gary D. ; Rothwell, Edward J. ; Havrilla, Michael J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    20
  • Issue
    5
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    298
  • Lastpage
    300
  • Abstract
    Waveguide probes are useful for extracting the electric and magnetic properties of material layers, but the accuracy of the results is limited by the accuracy of the theoretical model. Using more modes in the expansion of the waveguide fields produces better results, but the computational cost increases with the number of modes squared. This letter analyzes the dependence of solution accuracy on the number of modes used and, based on this, introduces an extrapolation technique that allows the number of modes to be significantly reduced with little loss of accuracy.
  • Keywords
    extrapolation; materials testing; mode matching; probes; waveguide junctions; waveguide theory; electric property extraction; extrapolation method; magnetic property extraction; material layers; material testing; mode matching methods; waveguide junctions; waveguide probe material; Error analysis; materials testing; microwave measurements; mode matching methods; waveguide junctions;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2010.2045600
  • Filename
    5440970