DocumentCode :
1460035
Title :
Replicating Tag Entries for Reliability Enhancement in Cache Tag Arrays
Author :
Wang, Shuai ; Hu, Jie ; Ziavras, Sotirios G.
Author_Institution :
Dept. of Comput. Sci. & Technol., Nanjing Univ., Nanjing, China
Volume :
20
Issue :
4
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
643
Lastpage :
654
Abstract :
Protecting on-chip cache memories against soft errors has become an increasing challenge in designing new generation reliable microprocessors. Previous efforts have mainly focused on improving the reliability of the cache data arrays. Due to its crucial importance to the correctness of cache accesses, the tag array also demands high reliability against soft errors. Exploiting the address locality of memory accesses, we propose to duplicate most recently accessed tag entries in a small tag replication buffer (TRB) thus to protect the information integrity of the tag array in the data cache. Experimental results show that our proposed TRB scheme achieves a high 90% access-with-replica (AWR) rate with low performance (~0%), energy (16.3%), and area (19.9%) overheads. We also conduct a detailed design space exploration for the TRB design and propose a selective TRB scheme that achieves a higher AWR rate (97.4%) for the dirty cachelines with negligible overheads. To provide a comprehensive evaluation of the tag-array reliability, we further conduct an architectural vulnerability factor (AVF) analysis for the tag array in the data cache and propose a refined metric, detected-without-replica-AVF (DOR-AVF), which combines the AVF and AWR analysis. Based on our DOR-AVF analysis, a selective TRB scheme with early write-back (S-TRB-EWB) is proposed, which achieves a zero DOR-AVF and 100% AWR rate at a negligible performance overhead. Results from statistical fault/error injection experiment also confirm the effectiveness of our TRB schemes and the achieved reliability of the cache tag array that recovers 100% of detected errors.
Keywords :
cache storage; integrated circuit design; integrated circuit reliability; memory architecture; microprocessor chips; performance evaluation; system-on-chip; AWR analysis; DOR-AVF analysis; TRB design; access-with-replica rate; architectural vulnerability factor analysis; cache data array reliability improvement; cache tag array reliability enhancement; design space exploration; detected-without-replica-AVF; dirty cachelines; information integrity; memory access address locality; microprocessor reliability; on-chip cache memory protection; soft errors; statistical error injection experiment; tag entry replication; tag replication buffer; Arrays; Computer aided manufacturing; Encoding; Error correction codes; Reliability engineering; System-on-a-chip; Cache tag array; reliability; soft error; tag replication buffer (TRB);
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2111469
Filename :
5720542
Link To Document :
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