DocumentCode :
1460043
Title :
PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration
Author :
Moo-Young Kim ; Hokyu Lee ; Chulwoo Kim
Author_Institution :
Electr. & Electron. Eng. Dept., Korea Univ., Seoul, South Korea
Volume :
20
Issue :
4
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
737
Lastpage :
741
Abstract :
A current source with a small current error has been proposed to maintain the bandwidth of the system without an increase in power consumption for a margin. It minimizes the current error under process, supply voltage, and temperature (PVT) variations. Because the on-resistance of the nMOS array is self-calibrated digitally by an on-chip digital PVT detector, a current error of only ±2% is achieved. The current source has been implemented in an 80-nm CMOS process, occupies 0.018 mm2 and consumes 94.9 μW at a supply voltage of 1.0 V.
Keywords :
CMOS digital integrated circuits; calibration; constant current sources; CMOS process; PVT variation tolerant current source; current error; nMOS array on-resistance; on-chip digital PVT detector; on-chip digital self-calibration; power 94.9 muW; power consumption; process-supply voltage-temperature variations; size 80 nm; voltage 1.0 V; Arrays; Clocks; Delay; Detectors; MOS devices; Power demand; Resistors; All digital gates; current source; on-chip; process, supply voltage, and temperature (PVT) detector; self-calibration;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2109971
Filename :
5720543
Link To Document :
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