• DocumentCode
    146023
  • Title

    InGaAs inversion layers band structure, electrostatics, and mobility modeling based on 8 Band k · p theory

  • Author

    Pham, A.-T. ; Jin, Seongwook ; Choi, Wan ; Lee, M.J. ; Cho, SeongHwan ; Kim, Y.-T. ; Lee, Ko-Hsin ; Park, Yu-Seop

  • Author_Institution
    Samsung Semicond., Inc., San Jose, CA, USA
  • fYear
    2014
  • fDate
    22-26 Sept. 2014
  • Firstpage
    114
  • Lastpage
    117
  • Abstract
    8 band k · p method is used to calculate subband structures of InGaAs inversion layers accounting for strong coupling between conduction and valence bands around Γ point as well as quantum confinement. Inversion layer mobility is computed employing Kubo-Greenwood formalism. Scatterings due to acoustic phonons, polar optical phonons, ionized impurities, interface fixed charges, surface roughness, and alloy disorder are included. The simulated low-field electron mobility results are in good agreement with in-house experimental data with and without an InP capping layer.
  • Keywords
    III-V semiconductors; carrier mobility; gallium arsenide; indium compounds; inversion layers; scattering; 8 band k · p theory; InGaAs; InGaAs inversion layers; InP; InP capping layer; Kubo-Greenwood formalism; acoustic phonons; alloy disorder; conduction bands; interface fixed charges; inversion layer mobility; ionized impurities; polar optical phonons; quantum confinement; scatterings; simulated low-field electron mobility; subband structures; surface roughness; valence bands; Couplings; Indium gallium arsenide; Indium phosphide; Logic gates; MOS devices; Phonons; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference (ESSDERC), 2014 44th European
  • Conference_Location
    Venice
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4799-4378-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2014.6948771
  • Filename
    6948771