Title :
High-Efficiency InGaAs/InP Photodetector Incorporating SOI-Based Concentric Circular Subwavelength Gratings
Author :
Duan, Xiaofeng ; Huang, Yongqing ; Ren, Xiaomin ; Shang, Yufeng ; Fan, Xinye ; Hu, Fuquan
Author_Institution :
State Key Lab. of Inf. Photonics & Opt. Commun., Beijing Univ. of Posts & Telecommun., Beijing, China
fDate :
5/15/2012 12:00:00 AM
Abstract :
A grating-integrated silicon-on-insulator (SOI)-based photodetector for use in the long wavelength was fabricated and characterized. An InGaAs/InP p-i-n structure was heterogeneously integrated on an SOI-based concentric circular subwavelength grating (CC-SWG) by means of a low-temperature bonding process with benzocyclobutene as the bonding agent. The light absorption of the device is enhanced due to high-index-contrast CC-SWGs as a broadband reflector. These features lead to an increase in quantum efficiency, for the whole S, C, and L communication bands, while maintaining a high speed. The measured quantum efficiency was increased by 39.5% with CC-SWGs in comparison with the device without gratings. A quantum efficiency of 53% at a wavelength of 1.55 and a 3-dB bandwidth of 25 GHz at a reverse bias of 3 V were simultaneously obtained in the device.
Keywords :
III-V semiconductors; diffraction gratings; gallium arsenide; indium compounds; light absorption; optical communication equipment; photodetectors; C communication band; InGaAs-InP; L communication band; S communication band; SOI based concentric circular subwavelength gratings; benzocyclobutene bonding agent; broadband reflector; grating integrated silicon-on-insulator; high efficiency photodetector; light absorption; low temperature bonding process; voltage 3 V; wavelength 1.55 mum; Gratings; Indium gallium arsenide; Indium phosphide; PIN photodiodes; Reflectivity; Wavelength measurement; Photodetectors; silicon circuits; subwavelength gratings;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2012.2189559