• DocumentCode
    1460545
  • Title

    Fine carrier and sampling frequency synchronization in OFDM systems

  • Author

    Morelli, Michele ; Moretti, Marco

  • Author_Institution
    Dipt. Ing. dell´´Inf., Univ. di Pisa, Pisa, Italy
  • Volume
    9
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    1514
  • Lastpage
    1524
  • Abstract
    This paper investigates the joint pilot-assisted estimation of the residual carrier frequency offset (RCFO) and sampling frequency offset (SFO) in an orthogonal frequency division multiplexing (OFDM) system. As it is known, the exact maximum-likelihood (ML) solution to this problem involves a bidimensional grid-search that cannot be pursued in practice. After introducing an enlarged set of auxiliary unknown parameters, however, the RCFO and SFO recovery tasks can be decoupled and the bidimensional search is thus replaced with a simpler mono-dimensional search. This results into an estimation algorithm of reasonable complexity which is suitable for practical implementation. To further reduce the processing load, we also present an alternative scheme yielding frequency estimates in closed-form. Numerical simulations indicate that the proposed methods outperform existing estimators available in the literature in terms of both estimation accuracy and error-rate performance.
  • Keywords
    OFDM modulation; frequency estimation; maximum likelihood estimation; signal sampling; synchronisation; OFDM system; frequency estimation; maximum likelihood solution; orthogonal frequency division multiplexing; residual carrier frequency offset; sampling frequency offset; synchronization; Digital video broadcasting; Estimation error; Frequency estimation; Frequency synchronization; Maximum likelihood estimation; OFDM; Phase estimation; Sampling methods; Timing; Wireless LAN; OFDM; frequency estimation; residual carrier frequency offset; sampling frequency offset;
  • fLanguage
    English
  • Journal_Title
    Wireless Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-1276
  • Type

    jour

  • DOI
    10.1109/TWC.2010.04.091058
  • Filename
    5441372