DocumentCode :
1460724
Title :
Guarding the gates
Volume :
46
Issue :
7
fYear :
2010
Firstpage :
468
Lastpage :
468
Abstract :
As the feature size of CMOS technology scales down, reliability and robustness become increasingly important. Researchers from Zhejiang University in China are seeking nanoscale CMOS ESD protection solutions that will meet the demands of the advancing technology.
Keywords :
CMOS integrated circuits; electrostatic discharge; integrated circuit reliability; CMOS technology; ESD protection; electrostatic discharge; integrated circuit failure; reliability; robustness;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2010.9029
Filename :
5442095
Link To Document :
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