Title :
Compact model for parametric instability under arbitrary stress waveform
Author :
Alagi, F. ; Rossetti, M. ; Stella, Roberto ; Vigano, Emanuele ; Raynaud, Philippe
Author_Institution :
STMicroelectron., Cornaredo, Italy
Abstract :
A deterministic compact model of instability is presented, capable of simulating reversible parametric drift under any periodic stress waveform and suitable for the implementation in a commercial simulator (Eldo UDRM). The methodology has been applied to NBTI-induced threshold voltage drift; an example is shown, in which recovery simulation is crucial for circuit design.
Keywords :
integrated circuit design; integrated circuit modelling; integrated circuit reliability; negative bias temperature instability; Eldo UDRM; NBTI induced threshold voltage drift; arbitrary stress waveform; circuit design; commercial simulator; deterministic compact model; parametric instability; periodic stress waveform; recovery simulation; reversible parametric drift; Integrated circuit modeling; Logic gates; Stress; Stress measurement; Temperature measurement; Threshold voltage; Voltage measurement; Compact model; NBTI; instability; recovery;
Conference_Titel :
Solid State Device Research Conference (ESSDERC), 2014 44th European
Conference_Location :
Venice
Print_ISBN :
978-1-4799-4378-4
DOI :
10.1109/ESSDERC.2014.6948812
