DocumentCode :
1460953
Title :
Using word-level ATPG and modular arithmetic constraint-solving techniques for assertion property checking
Author :
Chung-Yang Huan ; Cheng, Kwang-Ting
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume :
20
Issue :
3
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
381
Lastpage :
391
Abstract :
We present a new approach to checking assertion properties for register-transfer level (RTL) design verification. Our approach combines structural word-level automatic test pattern generation (ATPG) and modular arithmetic constraint-solving techniques to solve the constraints imposed by the target assertion property. Our word-level ATPG and implication technique not only solves the constraints on the control logic, but also propagates the logic implications to the datapath. A novel arithmetic constraint solver based on modular number system is then employed to solve the remaining constraints in datapath. The advantages of the new method are threefold. First, the decision-making process of the word-lever ATPG is confined to the selected control signals only. Therefore, the enumeration of enormous number of choices at the datapath signals is completely avoided. Second, our new implication translation techniques allow word-level logic implication being performed across the boundary of datapath and control logic and, therefore, efficiently cut down the ATPG search space. Third, our arithmetic constraint solver is based on modular instead of integral number systems. It can thus avoid the false-negative effect resulting from the bit-vector value modulation. A prototype system has been built that consists of an industrial front-end hardware description language (HDL) parser, a property-to-constraint converter, and the ATPG/arithmetic constraint-solving engine. The experimental results on some public benchmark and industrial circuits demonstrate the efficiency of our approach and its applicability to large industrial designs
Keywords :
automatic test pattern generation; constraint handling; formal verification; hardware description languages; high level synthesis; integrated circuit testing; logic testing; ATPG search space; arithmetic constraint solver; assertion property checking; datapath signals; decision-making process; implication translation techniques; industrial designs; industrial front-end hardware description language; modular arithmetic constraint-solving techniques; modular number system; property-to-constraint converter; register-transfer level design verification; target assertion property; word-level ATPG; Arithmetic; Automatic control; Automatic test pattern generation; Decision making; Electrical equipment industry; Engines; Hardware design languages; Logic; Prototypes; Signal processing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.913756
Filename :
913756
Link To Document :
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