• DocumentCode
    1460953
  • Title

    Using word-level ATPG and modular arithmetic constraint-solving techniques for assertion property checking

  • Author

    Chung-Yang Huan ; Cheng, Kwang-Ting

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • Volume
    20
  • Issue
    3
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    381
  • Lastpage
    391
  • Abstract
    We present a new approach to checking assertion properties for register-transfer level (RTL) design verification. Our approach combines structural word-level automatic test pattern generation (ATPG) and modular arithmetic constraint-solving techniques to solve the constraints imposed by the target assertion property. Our word-level ATPG and implication technique not only solves the constraints on the control logic, but also propagates the logic implications to the datapath. A novel arithmetic constraint solver based on modular number system is then employed to solve the remaining constraints in datapath. The advantages of the new method are threefold. First, the decision-making process of the word-lever ATPG is confined to the selected control signals only. Therefore, the enumeration of enormous number of choices at the datapath signals is completely avoided. Second, our new implication translation techniques allow word-level logic implication being performed across the boundary of datapath and control logic and, therefore, efficiently cut down the ATPG search space. Third, our arithmetic constraint solver is based on modular instead of integral number systems. It can thus avoid the false-negative effect resulting from the bit-vector value modulation. A prototype system has been built that consists of an industrial front-end hardware description language (HDL) parser, a property-to-constraint converter, and the ATPG/arithmetic constraint-solving engine. The experimental results on some public benchmark and industrial circuits demonstrate the efficiency of our approach and its applicability to large industrial designs
  • Keywords
    automatic test pattern generation; constraint handling; formal verification; hardware description languages; high level synthesis; integrated circuit testing; logic testing; ATPG search space; arithmetic constraint solver; assertion property checking; datapath signals; decision-making process; implication translation techniques; industrial designs; industrial front-end hardware description language; modular arithmetic constraint-solving techniques; modular number system; property-to-constraint converter; register-transfer level design verification; target assertion property; word-level ATPG; Arithmetic; Automatic control; Automatic test pattern generation; Decision making; Electrical equipment industry; Engines; Hardware design languages; Logic; Prototypes; Signal processing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.913756
  • Filename
    913756