DocumentCode :
146099
Title :
Impact of quantum modulation of the inversion charge in the MOSFET subthreshold regime
Author :
Hiblot, Gaspard ; Rafhay, Quentin ; Boeuf, F. ; Ghibaudo, Gerard
Author_Institution :
STMicroelectron., Crolles, France
fYear :
2014
fDate :
22-26 Sept. 2014
Firstpage :
286
Lastpage :
289
Abstract :
In this work, the impact of quantum modulation of the charge in the subtreshold regime is investigated for various architectures. Using Hänsch´s model, the reduction in threshold voltage roll-off induced by quantum effects in a double gate is investigated. Next, it is demonstrated with Poisson-Schrödinger simulations that there is a quantum-induced increase in sub-threshold swing for an InAs channel compared to a Si channel in a long-channel bulk device. Finally, a correction to the Bulk subthreshold swing classical model is proposed and validated on simulations. The results suggest that, contrary to double-gate devices, quantum modulation of the charge has an impact in the subthreshold regime for bulk architectures.
Keywords :
III-V semiconductors; MOSFET; Poisson equation; Schrodinger equation; indium compounds; semiconductor device models; Hänsch model; InAs; MOSFET subthreshold regime; Poisson-Schrödinger simulations; bulk subthreshold swing classical model; double gate; double-gate devices; inversion charge; long-channel bulk device; quantum effects; quantum modulation; subtreshold regime; threshold voltage roll-off; Doping; Equations; MOSFET; Mathematical model; Silicon; Threshold voltage; Bulk; Double-Gate; III-V; compact model; quantum effects; short-channel effects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference (ESSDERC), 2014 44th European
Conference_Location :
Venice
ISSN :
1930-8876
Print_ISBN :
978-1-4799-4378-4
Type :
conf
DOI :
10.1109/ESSDERC.2014.6948816
Filename :
6948816
Link To Document :
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