Efficient mode-matching analysis of discontinuities in finite planar substrates using perfectly matched layers

Author

Derudder, Henk ; Olyslager, Frank ; De Zutter, Daniel ; Van den Berghe, Steve

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Belgium

Volume

49

Issue

2

fYear

2001

fDate

2/1/2001 12:00:00 AM

Firstpage

185

Lastpage

195

Abstract

A new method to determine the reflection of substrate modes in finite substrate planar circuits is proposed. The perfectly matched layer (PML) concept is used to transform the open problem into a closed one. The discrete set of substrate, evanescent, and Berenger modes of the resulting anisotropic waveguides are then used in a mode-matching scheme to deduce the scattering coefficients of the substrate modes for oblique incidence on the edge of the substrate. We show results for single- and double-layered substrates and compare with finite-difference time-domain (FDTD) results. The combined perfectly matched layer (PML) mode-matching technique turns out to be very efficient

Keywords

MMIC; S-parameters; anisotropic media; electromagnetic wave reflection; mode matching; planar waveguides; surface electromagnetic waves; waveguide discontinuities; Berenger modes; PML concept; anisotropic waveguides; discontinuities; double-layered substrate; evanescent modes; finite planar substrates; finite substrate planar circuits; mode-matching analysis; oblique incidence; open problem; perfectly matched layers; reflection; scattering coefficients; single-layered substrates; substrate modes; Electromagnetic waveguides; Finite difference methods; MMICs; Optical scattering; Optical surface waves; Optical waveguides; Perfectly matched layers; Semiconductor waveguides; Surface waves; Time domain analysis;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/8.914270

Filename

914270