• DocumentCode
    1461154
  • Title

    Low-noise 650-nm-band AlGaInP visible laser diodes with a highly doped saturable absorbing layer

  • Author

    Kidoguchi, Isao ; Adachi, Hideto ; Kamiyama, Satoshi ; Fukuhisa, Toshiya ; Mannoh, Masaya ; Takamori, Akira

  • Author_Institution
    Semicond. Res. Center, Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    831
  • Lastpage
    837
  • Abstract
    Stable self-sustained pulsating and low-noise 650-nm-band AlGaInP visible laser diodes were demonstrated by adopting a novel structure, which has a highly doped saturable absorbing (SA) layer. Short carrier lifetime, which is indispensable for self-pulsation, was realized by applying high doping concentration to the p-type SA layer. 500-μm-long devices with 51%/51% coated facets were fabricated, resulting in the threshold current of 75 mA at 20°C. The temporal output power was measured at the average output power of 5 mW and the stable self-pulsation was observed up to an ambient temperature of 60°C. Therefore, the relative intensity noise (RIN) was kept about -140 dB/Hz in temperature ranging from 20°C to 60°C. Since the refractive index difference could be kept large and the optical mode could be confined effectively, the astigmatism in this work was below 3 μm at 5 mW against dc injection current. The lasers operated over 1350 h under the average output power of 5 mW at 60°C
  • Keywords
    III-V semiconductors; aluminium compounds; carrier density; carrier lifetime; gallium compounds; indium compounds; laser modes; laser noise; laser transitions; optical saturable absorption; refractive index; semiconductor doping; semiconductor lasers; 1350 h; 20 to 60 degC; 5 mW; 500 mum; 650 nm; 75 mA; AlGaInP; astigmatism; average output power; dc injection current; highly doped saturable absorbing layer; low-noise 650-nm-band AlGaInP visible laser diodes; optical mode; refractive index difference; relative intensity noise; self-pulsation; short carrier lifetime; stable self-pulsation; stable self-sustained pulsating; temporal output power; threshold current; Charge carrier lifetime; Diode lasers; Doping; Optical noise; Optical refraction; Power generation; Power measurement; Refractive index; Temperature distribution; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.572158
  • Filename
    572158