• DocumentCode
    1461213
  • Title

    Ablation measurements on EML insulators using free-arcs

  • Author

    Nornoo, K.B. ; King, T.L. ; Kim, K.

  • Author_Institution
    Houston Univ., TX, USA
  • Volume
    35
  • Issue
    1
  • fYear
    1999
  • fDate
    1/1/1999 12:00:00 AM
  • Firstpage
    294
  • Lastpage
    299
  • Abstract
    A new technique has been used to determine the ablation threshold and ablation rate of EML materials. Analysis of experimental data obtained by measuring free-arc velocity as a function of rail current in the presence of a background gas has been performed. A simulation of the free-arc motion has been developed using the graphical programming capabilities of LabVIEW. Nonablating theoretical data have been calculated from the free-arc model and have been used to identify the onset of ablation in the experimental data. Likewise, for the ablating case, the ablation coefficient can be extracted from the experimental data using system sensitivity and parameter identification methods. Ablation measurements were made on Lexan and mullite insulators. The ablation coefficients and ablation thresholds obtained indicate that Lexan ablates more significantly and has a lower ablation threshold than mullite, as expected
  • Keywords
    arcs (electric); insulators; parameter estimation; plasma devices; plasma diagnostics; railguns; velocity measurement; EML insulators; LabVIEW; Lexan insulators; ablation coefficient; ablation measurements; ablation rate; ablation threshold; electromagnetic launchers; free-arc motion simulation; free-arc velocity measurement; free-arcs; graphical programming capabilities; mullite insulators; nonablating theoretical data; parameter identification methods; plasma armature railgun; rail current; system sensitivity; Acceleration; Boring; Electromagnetic launching; Insulation; Plasma accelerators; Plasma materials processing; Plasma measurements; Plasma temperature; Railguns; Rails;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.738420
  • Filename
    738420