Title :
Testing ICs: getting to the core of the problem
Author :
Murray, Brian T. ; Hayes, John P.
Author_Institution :
Gen. Motors R&D Center, USA
fDate :
11/1/1996 12:00:00 AM
Abstract :
The article examines the market and technology trends affecting the testing of integrated circuits, with emphasis on the role of predesigned components-cores-and built in self test. We explain manufacturing testing, as opposed to design testing, which happens before manufacturing, and online testing, which happens after
Keywords :
built-in self test; computer testing; integrated circuit manufacture; integrated circuit testing; IC testing; built in self test; cores; integrated circuits; manufacturing testing; online testing; predesigned components; technology trends; Circuit faults; Circuit testing; Combinational circuits; Error correction; Fault detection; Pins; Semiconductor impurities; Sequential analysis; Sequential circuits; Signal processing;
