Comments on "Improved calibration and measurement of the scattering parameters of microwave integrated circuits" [with reply]

For the original article see ibid., vol.37, no.11, p.1675-80, 1989. In the above paper by R.R. Pantoja, M.J. Howes, J.R. Richardson, and R.D. Pollard generalized TRL method was proposed as an alternative to the TRL and LRL calibration methods. The contributions of the work, according to its authors, are the reformulation in terms of S-parameters and the removal of the requirement to specify a line length. The commenter argues that only the formulation, not the method itself, is novel. A detailed reply from the original authors follows in which the four specific points raised by the comments are dealt with in order to ensure proper understanding not only of what is described in their paper but also of the whole family of calibration procedures under the increasingly common TRL classification.<>